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Home  >  Journal list  >  Journal of the Ceramic Society of Japan  >  Vol.118  No.1380 (August) (2010)  >  pp.636-639

Journal of the Ceramic Society of Japan
<<Previous article Vol.118  No.1380 (August) (2010)   pp.636 - 639 Next article>>

Composition dependence of electrooptic property of epitaxial (Pb,La)(Zr,Ti)O3 films

Hiromi SHIMA1), Takashi IIJIMA2), Takashi NAKAJIMA1) and Soichiro OKAMURA1)
1) Department of Applied Physics, Faculty of Science, Tokyo University of Science
2) Research Center for Hydrogen Industrial Use and Storage, National Institute of Advanced Industrial Science and Technology

  The Zr/Ti ratio dependence of refractive index and electrooptic coefficient of epitaxial (Pb,La)(Zr,Ti)O3 (PLZT) films were investigated. PLZT films were fabricated on La-doped SrTiO3 (La-STO) substrates by a chemical solution deposition (CSD) method. Optical properties in TE- and TM-modes were measured individually using a prism coupling method. The refractive indexes both in TE- and TM-modes were as large as that of the polycrystalline film, and increased with increasing Ti/(Zr + Ti) ratio. The refractive index in TE-mode was larger than that in TM-mode because the PLZT films received compressive stress from the La-STO substrates due to lattice mismatch. The refractive index in TM-mode almost linearly decreased with increasing applied an electric field while that in TE-mode slightly increased and saturated around at 200 kV/cm. The Pockels coefficient in TM-mode r33 showed large change for compositions, while that in TE-mode r13 showed little change. The maximum Pockels coefficient rc of 156 pm/V was obtained for the epitaxial PLZT film with Ti/(Zr + Ti) ratio of 50%.

Electrooptic effect, Epitaxial film, PLZT, Composition dependence, Zr/Ti

Received: April 19, 2010
Accepted: July 15, 2010 , Published online: August 01, 2010
Copyright (c) 2010 The Ceramic Society of Japan



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