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Home  >  Journal list  >  Polymer Journal  >  Vol.45  No.1 (2013)  >  pp.100-108

Polymer Journal
<<Previous article Vol.45  No.1 (2013)   pp.100 - 108 Next article>>

Novel neutron reflectometer SOFIA at J-PARC/MLF for in-situ soft-interface characterization

Koji Mitamura1, Norifui L Yamada2, Hidenori Sagehashi2, Naoya Torikai3, Hiroshi Arita4, Masami Terada1, Motoyasu Kobayashi1, Setsuo Sato2, Hideki Seto2, Shinji Goko5, Michihiro Furusaka5, Tatsuro Oda6, Masahiro Hino7, Hiroshi Jinnai1,8,9 and Atsushi Takahara1,4,8,9
1Japan Science and Technology, ERATO Takahara Soft Interfaces Project, Fukuoka, Japan
2Institute of Material Structure Science, High Energy Accelerator Research Organization (KEK), Ibaraki, Japan
3Department of Chemistry for Materials, Graduate School of Engineering, Mie University, Mie, Japan
4Department of Chemistry and Biochemistry, Graduated School of Engineering, Kyushu University, Fukuoka, Japan
5Department of Mechanical and Intelligent System Engineering, Graduate School of Engineering, Hokkaido University, Hokkaido, Japan
6Department of Nuclear Engineering, Graduate School of Engineering, Kyoto University, Kyoto, Japan
7Kyoto University Research Reactor Institute, Kumatori, Osaka, Japan
8Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka, Japan
9International Institute for Carbon-Neutral Energy Research (WPI-I2CNER), Kyushu University, Fukuoka, Japan

Structural characterization of interfaces composed of soft materials (soft interfaces) helps in understanding their physical behavior. Neutron reflectometry is one of the most powerful tools to characterize interfacial structures with spatial resolution in nanometers. We have installed a novel horizontal-type time-of-flight neutron reflectometer SOFIA (SOFt Interface Analyzer) at the Japan Proton Accelerator Research Complex. The instrument is capable of accepting two downward neutron beams, at 2.2° and 5.7° to horizontal, which dedicate neutron reflectivity (NR) measurements over a wide range of neutron momentum transfer q (q=(4π/λ)sinθ, where λ and θ are wavelength and incident angle, respectively). The accuracy of NR up to q=6nm−1 was confirmed by measuring deuterated polystyrene (d-PS) thin films on a silicon (Si) wafer and multilayers of cadmium stearate prepared by the Langmuir–Blodgett method. NR at the deuterium oxide (D2O)/Si disk showed specular reflection down to 10−6–10−7 and q up to 2.0nm−1 along the perpendicular to the sample surface, which improved the precise analysis of swollen polyelectrolyte brush structure at the D2O interface. Then, time-resolved in-situ NR measurements were carried out at 1-min intervals to observe interfacial mixing of d-PS on the PS brush surface during 398K annealing, demonstrating that nonequilibrium behavior at the interfaces can be analyzed on the order of minutes.

in-situ characterization; solid/liquid interfaces; neutron reflectometer; polymer brushes; soft interfaces

Received: June 23, 2012 , Revised: July 23, 2012
Accepted: July 24, 2012 , Published online: September 05, 2012
© 2013 The Society of Polymer Science, Japan

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