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Home  >  Journal list  >  MATERIALS TRANSACTIONS  >  Vol.43  No.8 (2002)  >  pp.1931-1936

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Electrical Resistivity and Mössbauer Studies for the Structural Relaxation Process in Pd-Cu-Ni-P Glasses

Osami Haruyama1), Hisamichi M. Kimura2), Nobuyuki Nishiyama3), Akihisa Inoue2) and Juichiro Arai1)
1) Department of Physics, Faculty of Science and Technology, Tokyo University of Science
2) Institute for Materials Research, Tohoku University
3) Inoue Supercooled Glass Project, ERATO, Japan Science and Technology Corporation

The structural relaxation process in several Pd–Cu–Ni–P glasses was investigated by the electrical resistivity and the Mössbauer experiments. The change in the resistivity, ρ(300), and the corresponding slope, α(300)=(dρ⁄dT)300, at room temperature was measured after a given heat treatment. The change in ρ(300) with isochronal annealing below the glass transition temperature (≈572 K), starting from room temperature, demonstrated that the ρ(300) increased with temperature and decreased beyond 550 K. The isothermal annealing at 570 K exhibited that the ρ(300) showed an increase, about 1%, during an initial annealing stage for 3.0×102 s and remained almost constant up to 6.0×103 s, and hereafter monotonously decreased. The change in α(300) showed an opposite sign to that in ρ(300). The reversible change in ρ(300) due to isochronal annealing was observed in the heat treatment repeated between 350 and 550 K. The Mössbauer spectroscopy experiments were performed at room temperature to investigate the local structure change due to structural relaxation. The isomer shift and the quadrupole splitting for an annealed sample decreased in comparison with that of an as-quenched sample. Based on these results, the structural relaxation process and the structure change were discussed within the framework of the free volume model.

structural relaxation, electrical resistivity, weak localization, Mössbauer spectroscopy, free volume model

Received: March 13, 2002
Accepted: May 22, 2002 , Published online: September 06, 2005
Copyright (c) 2005 The Japan Institute of Metals



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