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Home  >  Journal list  >  MATERIALS TRANSACTIONS  >  Vol.52  No.3 (2011)  >  pp.319-323

MATERIALS TRANSACTIONS
<<Previous article Vol.52  No.3 (2011)   pp.319 - 323 Next article>>

Phase Characterization of Re-Based Diffusion Barrier Layer on Nb Substrate

Eni Sugiarti1)2), Youngmin Wang1), Naoyuki Hashimoto1), Somei Ohnuki1) and Toshio Narita3)
1) Laboratory of Advanced Materials, Faculty of Engineering, Hokkaido University
2) Research Center for Physics, Indonesian Institute of Sciences (LIPI)
3) Advanced Barrier-Coating Laboratory, Faculty of Engineering, Hokkaido University


An electron microscopy phase characterization was carried out for a Re-based diffusion barrier layer, which was deposited on the Nb substrate used as an ultra high temperature material. The coating process produced three layers; an outer Cr(Re) layer, an intermediate Cr-Nb-Re layer, and an inner Nb(Re) layer. The Cr-Nb-Re layer is considered to act as a diffusion barrier layer between the substrate and the outer Cr(Re) reservoir layer. The Cr(Re) and Nb(Re) layers are in single phase with a similar bcc structures, but they are different in structure from the intermediate layer, which is composed of a dual phase of Re63Cr20Nb17 with a cubic structure and Nb42Re33Cr25 with a hexagonal structure determined by transmission electron microscopy (TEM) in this study.


Keyword:
phase characterization, crystal structure, diffusion barrier layer, niobium, transmission electron microscopy

Received: September 02, 2010
Accepted: November 24, 2010 , Published online: February 25, 2011
Copyright (c) 2011 The Japan Institute of Metals

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