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Home  >  Journal list  >  Journal of the Ceramic Society of Japan  >  Vol.121  No.1416 (August) (2013)  >  pp.598-601

Journal of the Ceramic Society of Japan
<<Previous article Vol.121  No.1416 (August) (2013)   pp.598 - 601 Next article>>

Oxygen vacancies in PbTiO3 thin films probed by resonant Raman spectroscopy

Ken NISHIDA1), Minoru OSADA2), Joe SAKAI3), Nobuaki ITO4), Takashi KATODA5), Rikyu IKARIYAMA6), Hiroshi FUNAKUBO6), Hiroki MORIWAKE7), Takashi YAMAMOTO1)
1) Department of Communications Engineering, National Defense Academy 2) International Center for Materials Nanoarchitectonics, National Institute for Materials Science 3) Laboratoire GREMAN, UMR 7347 CNRS, Université François Rabelais de Tours 4) Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology 5) Department of Electronic and Photonic Engineering, Kochi University of Technology 6) Department of Innovative and Engineered Materials, Tokyo Institute of Technology 7) Nanostructures Research Laboratory, Japan Fine Ceramics Center

Resonant Raman spectroscopy was applied to evaluate oxygen vacancies in PbTiO3–x thin films that were heat treated in a hydrogen atmosphere at various temperatures. Additional mode related to oxygen vacancies occurred in the resonant Raman measurement condition, and its intensity was in proportion to the oxygen vacancy concentration. This correlation offers a simple and useful probe for oxygen vacancies in oxide-based devices.


Keyword:
PbTiO3 thin films, Oxygen vacancy, Heat treatment, Resonant Raman spectroscopy, Photoluminescence, Non-Rutherford elastic resonance scattering

Received: April 15, 2013
Accepted: April 29, 2013 , Published online: August 01, 2013
Copyright © 2013 The Ceramic Society of Japan

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