You are not logged in Total: 7journals, 20,727articles Online
AccountAccount
Login / Register
Forgot Login?
 
Main menuMain menu
What's new
Journal list
Visiting ranking
Phrase ranking
Polls
About us
 
SearchSearch
 
Journal Site
Advanced Search
 

Home  >  Journal list  >  Journal of the Ceramic Society of Japan  >  Vol.122  No.1426 (June) (2014)  >  pp.430-435

Journal of the Ceramic Society of Japan
<<Previous article Vol.122  No.1426 (June) (2014)   pp.430 - 435 Next article>>

Chemical and structural effects on ionic conductivity at columnar grain boundaries in yttria-stabilized zirconia thin films

Takanori KIGUCHI1), Yumiko KODAMA1), Toyohiko J. KONNO1), Hiroshi FUNAKUBO2), Osamu SAKURAI3), Kazuo SHINOZAKI3)
1) Institute for Materials Research, Tohoku University 2) Interdisciplinary Graduate School of Science and Engineering 3) Graduate School of Science and Engineering, Tokyo Institute of Technology

This study elucidated the effects of coherence and chemical composition on ionic conductivity at columnar grain boundaries of 6 mol % Y2O3 doped ZrO2 (YSZ) thin films. The YSZ thin films were deposited with several orientation textures on MgO (100), Al2O3 (102), and SiO2-glass substrates using metal–organic chemical vapor deposition (MOCVD). Impedance measurements revealed the total ionic conductivity of the thin films. The activation energy of the ionic conduction of YSZ thin films on MgO or Al2O3 substrates was 90–120 kJ/mol. These films showed similar dependence that simply increased along with decreasing coherency at the columnar grain boundaries. However, that of YSZ thin films on SiO2 glass substrate showed dependence of the coherency at the columnar grain boundaries, but the value is higher than those of the films on MgO or Al2O3 substrates by more than 20 kJ/mol. Structural and compositional analyses clarified that the second phase of SiO2 is segregated at mid-gaps between columnar grain boundaries in YSZ thin films on a SiO2 glass substrate. Results show that two factors affect ionic conductivity at the columnar grain boundaries in YSZ thin films: structural coherency and the second phase of ionic insulator.


Keyword:
Zirconia, Columnar structure, Grain boundary, Coherency, SiO2, Ionic conduction, Thin film, TEM, HAADF–STEM

Received: December 18, 2013
Accepted: February 10, 2014 , Published online: June 01, 2014
Copyright © 2014 The Ceramic Society of Japan

PDFPDF file (J-STAGE)J-STAGEJ-STAGE


SPARC Japan

Terms of Use | Privacy Policy