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Home  >  Journal list  >  MATERIALS TRANSACTIONS  >  Vol.43  No.4 (2002)  >  pp.762-765

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Growth Condition and X-ray Analysis of Single Al64Cu23Fe13 Icosahedral Quasicrystal by the Czochralski Method

Yoshihiko Yokoyama1), Yoshie Matsuo2), Kazuki Yamamoto2) and Kenji Hiraga3)
1) Faculty of Engineering, Himeji Institute of Technology
2) Department of Physics, Nara Women’s University
3) Institute for Materials Research, Tohoku University

Growth conditions for the preparation of a single Al64Cu23Fe13 icosahedral (I-) quasicrystal with excellent quasicrystallinity were examined using the Czochralski method. The appreciation of the quasicrystallinity of the grown single quasicrystal was performed by X-ray structural analysis. The full widths at half-maximum (FWHM) of the Bragg reflections along 2-, 3- and 5-fold symmetry directions have no Q|| and Q dependence. Where the Q|| and Q mean the phason momentum and real scattering vector. Furthermore, peak shifts from ideal Bragg positions were not observed. These means that the grown Al64Cu23Fe13 quasicrystal by the Czochralski method has perfect I-phase structure.

single Al64Cu23Fe13 I-quasicrystal, Czochralski method, X-ray analysis, phason strain

Received: December 05, 2001
Accepted: February 19, 2002 , Published online: September 06, 2005
Copyright (c) 2005 The Japan Institute of Metals



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