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Home  >  Journal list  >  MATERIALS TRANSACTIONS  >  Vol.47  No.2 (2006)  >  pp.259-262

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Analysis of Defects Formation and Mobility during Ion Irradiation by Coherent Precipitates

Zheng-cao Li1), Hiroaki Abe2) and Naoto Sekimura1)
1) Department of Quantum Engineering and Systems Science, School of Engineering, University of Tokyo
2) Nuclear Professional School, School of Engineering, University of Tokyo

Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method have been applied to study the deep radiation damage and depth profile of point defects generated during ion irradiation in Cu–1 mass%Co alloy specimens by means of coherent precipitates. The specimens were irradiated at a temperature range of 250 to 500°C by 4 and 0.6 MeV self Cu ions to a dose of 0.3 dpa. The damage range has been observed at depths well beyond that expected from ion damage range calculations.

ion irradiation, point defect, depth profile

Received: October 26, 2005
Accepted: December 21, 2005 , Published online: February 17, 2006
Copyright (c) 2006 The Japan Institute of Metals



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