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Home  >  Journal list  >  Polymer Journal  >  Vol.45  No.1 (2013)  >  pp.109-116

Polymer Journal
<<Previous article Vol.45  No.1 (2013)   pp.109 - 116 Next article>>

Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

Hiroki Ogawa1, Hiroyasu Masunaga1, Sono Sasaki1, Shunji Goto1, Takashi Tanaka2, Takamitsu Seike1, Sunao Takahashi1, Kunikazu Takeshita1, Nobuteru Nariyama1, Haruhiko Ohashi1, Toru Ohata1, Yukito Furukawa1, Tomohiro Matsushita1, Yasuhide Ishizawa1, Naoto Yagi1, Masaki Takata1,2,3, Hideo Kitamura2, Atsushi Takahara4, Kazuo Sakurai4, Kohji Tashiro4, Toshiji Kanaya4, Yoshiyuki Amemiya4, Kazuyuki Horie4, Mikihito Takenaka4, Hiroshi Jinnai4, Hiroshi Okuda4, Isamu Akiba4, Isao Takahashi4, Katsuhiro Yamamoto4, Masamichi Hikosaka4, Shinichi Sakurai4, Yuya Shinohara4, Yasunori Sugihara5 and Akihiko Okada5
1Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Sayo, Hyogo, Japan
2RIKEN SPring-8 Center, Sayo, Hyogo, Japan
3The University of Tokyo, Tokyo, Japan
4FSBL (Representatives of the academic members), Sayo, Hyogo, Japan
5FSBL (Representatives of the industrial members), Sayo, Hyogo, Japan

To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.


Keyword:
FSBL; grazing incidence small/wide-angle X-ray scattering; grazing incidence X-ray diffraction; polymer thin films; SPring-8; X-ray reflectivity

Received: September 03, 2012 , Revised: September 24, 2012
Accepted: September 25, 2012 , Published online: November 14, 2012
© 2013 The Society of Polymer Science, Japan

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